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WEOAMA06 |
Concepts and Instrumentation for Scanning Free X-ray Emission Spectroscopy | |
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X-ray Emission spectroscopy is a common tool for the study of the electronic structure of chemical compounds*,** and a widely used technic at synchrotron facilities. There are two different principles. Johansson spectrometers with scanning excitation energy rely on highly precise motorized axes, whereas polychromatic Von Hamos spectrometers don't need the scanning modus. We present different von Hamos Spectrometer concepts and instruments dedicated for synchrotron and laboratory use. The presentation includes everything from the idea, planning, development, design and mounting to the commissioning, alignment and first operation. Furthermore we found a common solution for both different excitations, synchrotron and laboratory sources with respect to reliable energy alignment. The requirements to the mechanics, especially positioning devices which are both commercial and self-developed will also be explained.
*C.J. Pollock, S. DeBeer, Accounts of Chemical Research, 48, 2967, (2015) **C.J. Pollock, M.U. Delgado-Jaime, M. Atanasov, F. Neese, S. DeBeer, J. of the American Chemical Society 136, 9453 (2014) |
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Slides WEOAMA06 [7.156 MB] | |
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