Author: Kaser, H.K.
Paper Title Page
THPH25
The MLS-IDB: A Versatile Beamline for UV to Soft X-Ray Surface Analytics  
 
  • H.K. Kaser, A. Gottwald, M. Kolbe
    PTB, Berlin, Germany
 
  The PTB operates its own electron storage ring MLS [1] in Berlin. Utilizing the radiation from a U125 undulator, an IDB delivers high flux with high spectral purity from 4.4 nm to 800 nm. The undulator radiation is monochromatized by a normal incidence-grazing incidence (NI-GI) hybrid plane grating monochromator. Different coatings are used to cover the whole wavelength range. The beamline is optimized to suppress false light contributions and to allow a high reliability of the monitoring of the radiation intensity. Thus, it can provide quantitative photon num-bers for traceable measurements. Currently, MLS-IDB is mainly used for investigations of interfaces and nanostructures by various experimental techniques, such as photoelectron spectroscopy [2,3,4] as well as spectroscopic ellipsometry [5]. The investigations of the relation between the optical properties and the inner structure of selected samples provide further information about promising materials in the semiconductor as well as photovoltaic research and manufacturing. Furthermore, a sample preparation chamber with modular design has been recently put into operation.
[1] DOI:10.1088/0026-1394/49/2/S146
[2] DOI:10.1016/j.elspec.2017.05.008
[3] DOI:10.1038/ncomms9287
[4] DOI:10.1088/0957-4484/27/32/324005
[5] DOI:10.1063/1.4878919
 
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