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WEPH01 |
Evaluation of Anisotropic Simulations & Redesign of the BXDS High Energy Monochromator Bent Laue Diffraction Crystal Holders |
199 |
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- M.J.P. Adam, N. Appathurai
CLS, Saskatoon, Saskatchewan, Canada
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The Brockhouse X-ray Diffraction and Scattering Sector (BXDS) High-Energy (HE) beamline includes a bent Laue diffraction monochromator. The BXDS HE monochromator achieves energy ranges of 35keV to 90 keV through the bent Laue diffraction of two silicon crystal wafers. Each wafer (460um & 1000um thick) is bent to achieve specific sagittal radius (Rs); subsequent anticlastic meridional radius (Rm) results from the anisotropic nature of silicon, creating the desired x-ray focusing parameters. During the initial conditioning of the BXDS HE monochromator spurious diffraction patterns were observed indicating that the crystal holder, and crystal integrity failed. Alternative holder designs were evaluated using Finite Element Analysis (FEA; ANSYS) simulations to ensure that appropriate Rs and Rm values were achieved, verification of the crystal holder Rs was completed using contact 3D measurement (FaroArm), and the crystal surface was assessed using 3D optical profiling (Zygo). A superior holder was chosen based on the results, and replaced. The performance of the BXDS HE monochromator has been characterized, indicating the new holder design has achieved x-ray focusing parameters.
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DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-MEDSI2018-WEPH01
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WEPH04 |
Finite Element Analysis of a Combined White Beam Filter and Visual Screen Using CVD Diamond for the BXDS Beamline |
208 |
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- D.M. Smith, M.J.P. Adam, G.R. Barkway, A.J. Janis
CLS, Saskatoon, Saskatchewan, Canada
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A white beam filter and visual screen are required for the undulator beamline at the Brockhouse X-Ray Diffraction and Scattering Sector. Reusing a water-cooled copper paddle with a 0.1 mm thick chemical vapor deposition (CVD) diamond foil, a combined filter and screen design is presented. The Canadian Light Source previously experienced failure of CVD diamond filters when exposed to high flux density white beam. Finite element analysis (FEA) was done to determine if the CVD diamond will fracture under the undulator heat load. Conservative failure criteria are selected for CVD diamond based on available literature for the following failure mechanisms: high temperature, thermal fatigue, and temperature induced stress. Four designs are analyzed using FEA models simulating effects of clamping pressure and heat load on the CVD diamond. The simulations are verified by optimizing the model mesh, comparing results against hand calculations, and comparing theoretical absorbed heat load to simulated values. Details of the modeling method are reviewed and results for the different designs evaluated. Suggestions for future testing of CVD diamond in a synchrotron setting will be discussed.
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DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-MEDSI2018-WEPH04
|
|
Export • |
reference for this paper using
※ BibTeX,
※ LaTeX,
※ Text/Word,
※ RIS,
※ EndNote (xml)
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