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TY - CONF AU - Oprondek, S.M. AU - Downey, J.S. AU - Jaski, Y. AU - Lee, S.H. AU - Mulvey, J. AU - Ramanathan, M. AU - Westferro, F. AU - Yang, B.X. ED - Schaa, Volker RW ED - Tavakoli, Keihan ED - Tilmont, Manuel TI - Next Generation X-ray Beam Position Monitor System for the Advanced Photon Source MBA Upgrade J2 - Proc. of MEDSI2018, Paris, France, 25-29 June 2018 C1 - Paris, France T2 - Mechanical Engineering Design of Synchrotron Radiation Equipment and Instrumentation T3 - 10 LA - english AB - The Advanced Photon Source (APS) upgrade from double-bend achromats (DBA) to multi-bend achromats (MBA) lattice has increased the need for reliable diagnos-tic systems. This upgrade will decrease the size of the photon beam drastically and beam current will be in-creased from 100 mA to 200 mA. The small beam and intense heat loads provided by the upgraded APS requires unique and innovative approaches to beam position monitoring. To meet the need for a reliable diagnostic system for the APS upgrade, the next generation X-ray Beam Position Monitoring System (XBPM) is required which includes the first XBPM (XBPM1), the Intensity Monitor (IM1) and the second XBPM (XBPM2). This paper presents progress and status of the current configu-ration of the XBPM system especially the development work involving the IM1 and XBPM2. The R&D work to develop an alternative XBPM1 using the Compton scattering principle is also presented. PB - JACoW Publishing CP - Geneva, Switzerland SP - 99 EP - 101 KW - detector KW - photon KW - undulator KW - scattering KW - monitoring DA - 2018/12 PY - 2018 SN - 978-3-95450-207-3 DO - 10.18429/JACoW-MEDSI2018-TUPH29 UR - http://jacow.org/medsi2018/papers/tuph29.pdf ER -