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WEPE39 |
Fabrication, Assembly, and Metrology Methods to Optimize an Adjustable Exit Slit for a Soft X-ray Beamline |
ion, feedback, vacuum, site |
374 |
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- J.H. Takakuwa, C.D. Hernikl, T.M. Lipton, T.A. Stevens, T. Warwick
LBNL, Berkeley, California, USA
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Exit slit edge geometry and paired edge parallelism can directly impact performance of a synchrotron beamline. At the same time, maximizing the performance of an existing design is often a financial and logistical necessity. The construction project for beamline 7.0.1 (BL7.0.1, COherent Scattering and MICroscopy (COSMIC)) at the Advanced Light Source (ALS) facility located at Lawrence Berkeley National Laboratory (LBNL) consists of two branch lines, each of which has vertical and horizontal slit assemblies. These assemblies were fabricated from a preexisting design, positively impacting project schedule and budget. Apart from orientation, the slit assemblies are identical. The goal for parallelism is ± 2 microns over the full 25 mm length. The each slit blade edge can travel ± 5 mm about the beam center with the resolution of a micron; slits can scan over that range with a nominal size of about 10 microns. A variety of fabrication and metrology techniques were implemented to maximize the performance of the current design and future areas of improvement in fabrication, metrology, and design were identified.
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Poster WEPE39 [3.111 MB]
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DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-MEDSI2016-WEPE39
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About • |
paper received ※ 07 September 2016 paper accepted ※ 16 September 2016 issue date ※ 22 June 2017 |
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