Author: Four, A.
Paper Title Page
TUPO030 Precise Evaluation of Characteristic of the Multi-layer Thin-film Superconductor Consisting of NbN and Insulator on Pure Nb Substrate 391
TUOP03   use link to see paper's listing under its alternate paper code  
 
  • R. Katayama, Y. Iwashita, H. Tongu
    Kyoto ICR, Uji, Kyoto, Japan
  • C.Z. Antoine
    CEA/IRFU, Gif-sur-Yvette, France
  • A. Four
    CEA/DRF/IRFU, Gif-sur-Yvette, France
  • H. Hayano, T. Kubo, T. Saeki
    KEK, Ibaraki, Japan
  • H. Ito
    Sokendai, Ibaraki, Japan
  • R. Ito, T. Nagata
    ULVAC, Inc, Chiba, Japan
  • H. Oikawa
    Utsunomiya University, Utsunomiya, Japan
 
  In recent years, it has been pointed out that the maximum accelerating gradient of a superconducting RF cavity can be pushed up by coating the inner surface of the cavity with a multilayer thin-film structure that consists of alternating insulating and superconducting layers. In this structure, the principal parameter that limits the performance of the cavity is the critical magnetic field or effective Hc1 at which vortices start penetrating into the superconductor layer, and it is predicted to depend on the combination of the film thickness. We made samples that have NbN/SiO2 thin-film structure on pure Nb substrate with several thicknesses of NbN film deposited using DC magnetron sputtering method. Here, we report the measurement results of effective Hc1 of the NbN sample with a thickness of 200 nm by using the third-harmonic voltage method. In addition, we report the preliminary results to evaluate the dependence of the effective Hc1 on the thickness of the NbN film in the range 50 nm-200 nm.  
slides icon Slides TUPO030 [0.305 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-LINAC2018-TUPO030  
About • paper received ※ 18 September 2018       paper accepted ※ 21 September 2018       issue date ※ 18 January 2019  
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TUPO066 Lower Critical Field Measurement of Thin Film Superconductor 484
 
  • H. Ito
    Sokendai, Ibaraki, Japan
  • C.Z. Antoine
    CEA/IRFU, Gif-sur-Yvette, France
  • A. Four
    CEA/DRF/IRFU, Gif-sur-Yvette, France
  • H. Hayano, T. Kubo, T. Saeki
    KEK, Ibaraki, Japan
  • R. Ito, T. Nagata
    ULVAC, Inc, Chiba, Japan
  • Y. Iwashita, R. Katayama, H. Tongu
    Kyoto ICR, Uji, Kyoto, Japan
  • H. Oikawa
    Utsunomiya University, Utsunomiya, Japan
 
  Funding: The work is supported by Japan Society for the Promotion of Science Grant-in-Aid for Young Scientist (A) No.17H04839.
Superconducting thin film is the promising technology to increase the performance of SRF cavities. The lower critical field Hc1, which is one of the important physical parameters characterizing a superconducting material, will be enhanced by coating Nb with thin film superconductor such as NbN. To investigate the Hc1, we developed the Hc1 measurement system using the third harmonic response of applied AC magnetic field. The measurement system consists of helium cryostat with two of GM refrigerators, sample Cu stage, solenoid coil Cu mount, solenoid coil, temperature sensors, and liquid helium level meter. AC magnetic field is produced by a coil which is driven by function generator and power amplifier at around 1 kHz. In order to control the temperature of the sample, we installed heaters and thermal anchors which could be moved by the motor. By this temperature control the sample state can be easily transferred from Meissner state to mixed state. So that the measurement is repeated for various applied magnetic field, and the transition curve can be made. In this report, measurement result of the bulk Nb sample and NbN-SiO2 multilayer thin film sample will be discussed.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-LINAC2018-TUPO066  
About • paper received ※ 19 September 2018       paper accepted ※ 20 September 2018       issue date ※ 18 January 2019  
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THPO097 Recent Results for Study of Ceramic and Copper Plating for Power Couplers 905
 
  • Y. Yamamoto, E. Kako, S. Michizono
    KEK, Ibaraki, Japan
  • E. Cenni
    CEA/IRFU, Gif-sur-Yvette, France
  • A. Four
    CEA/DRF/IRFU, Gif-sur-Yvette, France
  • Y. Okii
    Nomura Plating Co, Ltd., Osaka, Japan
 
  KEK has conducted a survey to select an optimum ceramic after withdrawal by a domestic manufacturing company two years ago. For this selection, there are four important items on the properties of ceramic; that is, relative permittivity, dielectric loss tangent, surface and volume resistance, and secondary electron emission coefficient. For measurements of these parameters, five kinds of ceramic samples supplied from three companies were measured using three kinds of measurement systems. For measurement of secondary electron emission, scanning electron microscope (SEM) with beam blanking system was used. On the other hand, residual resistivity ratio (RRR) for copper plating, which is the most important item for quality control, has also been carried out while changing plating thickness and acid temperature. In this report, the recent results for these studies will be presented in detailed.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-LINAC2018-THPO097  
About • paper received ※ 12 September 2018       paper accepted ※ 20 September 2018       issue date ※ 18 January 2019  
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