Paper |
Title |
Other Keywords |
Page |
TH-84 |
Beam Position Monitor Sensitivity for Low-β Beams
|
proton, DTL, instrumentation, ion |
905 |
|
- R.E. Shafer
LANL, Los Alamos, New Mexico, USA
|
|
TH-88 |
Secondary Electron Monitors in Linacs for Intense Neutron Sources (Oral Poster)
|
electron, ion, controls, focusing |
917 |
|
- A.M. Tron
MEPhi, Moscow Engineering Physics Institute, Moscow, Russia
|
|
TH-92 |
Beam Position Monitor Based on Diffraction Radiation
|
radiation, photon, controls, background |
926 |
|
- K.G. Antonyan, L.G. Hakopyan, E.M. Laziev, S.N. Movsesyan, A.G. Oganessian
Yerevan Physics Institute, Yerevan, Armenia
|
|