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Sears, J.
Paper
Title
Page
WE3-35
Does UHV Annealing above 1100C as a Final Surface Treatment Reduce Field Emission Loading in Superconducting Cavities?
397
H. Padamsee
, K. Gendreau, W. Hartung, J. Kirchgessner, D. Moffat, R. Noer, D. Rubin,
J. Sears
, Q. Shu
Cornell University, Ithaca, New York, USA