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@inproceedings{yoskowitz:ipac2021-wepab104,
author = {J.T. Yoskowitz and J.M. Grames and J. Hansknecht and C. Hernandez-Garcia and G.A. Krafft and G.G. Palacios Serrano and M. Poelker and M.L. Stutzman and R. Suleiman and S.A.K. Wijethunga and S.B. van der Geer},
% author = {J.T. Yoskowitz and J.M. Grames and J. Hansknecht and C. Hernandez-Garcia and G.A. Krafft and G.G. Palacios Serrano and others},
% author = {J.T. Yoskowitz and others},
title = {{Improving the Operational Lifetime of the CEBAF Photo-Gun by Anode Biasing}},
booktitle = {Proc. IPAC'21},
pages = {2840--2842},
eid = {WEPAB104},
language = {english},
keywords = {cathode, laser, simulation, electron, gun},
venue = {Campinas, SP, Brazil},
series = {International Particle Accelerator Conference},
number = {12},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {08},
year = {2021},
issn = {2673-5490},
isbn = {978-3-95450-214-1},
doi = {10.18429/JACoW-IPAC2021-WEPAB104},
url = {https://jacow.org/ipac2021/papers/wepab104.pdf},
note = {https://doi.org/10.18429/JACoW-IPAC2021-WEPAB104},
abstract = {{The operating lifetime of GaAs-based photocathodes in DC high voltage electron photo-guns is dominated by the ionization rate of residual beamline gas molecules. In this work, experiments were performed to quantify the improvement in photocathode charge lifetime by biasing the photo-gun anode with a positive voltage, which repels ions generated downstream of the anode. The photo-cathode charge lifetime improved by almost a factor of two when the anode was biased compared to the usual grounded configuration. Simulations were performed using the particle tracking code General Particle Tracer (GPT) with a new custom element. The simulation results showed that both the number and energy of ions play a role in the pattern of QE degradation. The experiment results and conclusions supported by GPT simulations will be presented.}},
}