A Sub-Micron Resolution, Bunch-by-Bunch Beam Trajectory Feedback System and Its Application to Reducing Wakefield Effects in Single-Pass Beamlines

Bett, Douglas; Burrows, Philip; Kubo, Kiyoshi; Okugi, Toshiyuki; Perry, Colin; Ramjiawan, Rebecca; Terunuma, Nobuhiro

doi:10.18429/JACoW-IPAC2021-TUPAB020

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Text/Word citation export for TUPAB020: A Sub-Micron Resolution, Bunch-by-Bunch Beam Trajectory Feedback System and Its Application to Reducing Wakefield Effects in Single-Pass Beamlines

D.R. Bett et al., “A Sub-Micron Resolution, Bunch-by-Bunch Beam Trajectory Feedback System and Its Application to Reducing Wakefield Effects in Single-Pass Beamlines”, in Proc. IPAC'21, Campinas, SP, Brazil, May 2021, pp. 1382-1385. doi:10.18429/JACoW-IPAC2021-TUPAB020