A Sub-Micron Resolution, Bunch-by-Bunch Beam Trajectory Feedback System and Its Application to Reducing Wakefield Effects in Single-Pass Beamlines

Bett, Douglas; Burrows, Philip; Kubo, Kiyoshi; Okugi, Toshiyuki; Perry, Colin; Ramjiawan, Rebecca; Terunuma, Nobuhiro

doi:10.18429/JACoW-IPAC2021-TUPAB020

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LaTeX citation export for TUPAB020: A Sub-Micron Resolution, Bunch-by-Bunch Beam Trajectory Feedback System and Its Application to Reducing Wakefield Effects in Single-Pass Beamlines

%\cite{bett:ipac2021-tupab020}
\bibitem{bett:ipac2021-tupab020}
   D.R. Bett, P. Burrows, K. Kubo, T. Okugi, C. Perry, R.L. Ramjiawan, and \emph{et al.},
%   D.R. Bett, P. Burrows, K. Kubo, T. Okugi, C. Perry, R.L. Ramjiawan, and N. Terunuma,
%   D.R. Bett \emph{et al.},
   \textquotedblleft{A Sub-Micron Resolution, Bunch-by-Bunch Beam Trajectory Feedback System and Its Application to Reducing Wakefield Effects in Single-Pass Beamlines}\textquotedblright,
% --- abbreviated form (published paper) - JACoW template Feb 2018 ---
   in \emph{Proc. IPAC'21}, Campinas, SP, Brazil, May 2021, pp. 1382--1385.
   \url{doi:10.18429/JACoW-IPAC2021-TUPAB020}
% --- additional material -ISSN/ISBN--
%  ISBN: 978-3-95450-214-1, ISSN: 2673-5490