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RIS citation export for WEPGW014: A Non-Invasive THz Spectrometer for Bunch Length Characterization at European XFEL

TY  - CONF
AU  - Lockmann, N.M.
AU  - Gerth, C.
AU  - Peier, P.
AU  - Schmidt, B.
AU  - Wesch, S.
ED  - Boland, Mark
ED  - Tanaka, Hitoshi
ED  - Button, David
ED  - Dowd, Rohan
ED  - Schaa, Volker RW
ED  - Tan, Eugene
TI  - A Non-Invasive THz Spectrometer for Bunch Length Characterization at European XFEL
J2  - Proc. of IPAC2019, Melbourne, Australia, 19-24 May 2019
CY  - Melbourne, Australia
T2  - International Particle Accelerator Conference
T3  - 10
LA  - english
AB  - The European X-ray Free-Electron Laser provides one of the most powerful X-ray laser pulses to a wide range of experiments. These experiments strongly benefit from the exact knowledge of the electron bunch current profile and demand for stable and shortest-possible pulse lengths. During the 2018 summer shutdown, the 4-staged grating spectrometer CRISP* has been installed at a diffraction radiation (DR) beamline just upstream of the undulator beamline switchyard. The DR at final electron beam energies of up to 17.5 GeV enables non-invasive bunch length characterization based on form factor measurements down to a few micrometers. Fast detectors and electronics allow for the characterization of the whole bunch train with repetition rates above 1 MHz. This contribution will present commissioning results of the THz beamline as well as first measured form factors and reconstructed electron current profiles.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 2495
EP  - 2497
KW  - electron
KW  - FEL
KW  - radiation
KW  - diagnostics
KW  - factory
DA  - 2019/06
PY  - 2019
SN  - 978-3-95450-208-0
DO  - DOI: 10.18429/JACoW-IPAC2019-WEPGW014
UR  - http://jacow.org/ipac2019/papers/wepgw014.pdf
ER  -