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RIS citation export for THPTS080: Novel Technique Ion Assisted In-Situ Coating of Long, Small Diameter, Accelerator Beam Pipes with Compacted Thick Crystalline Copper Film

TY  - CONF
AU  - Hershcovitch, A.
AU  - Blaskiewicz, M.
AU  - Brennan, J.M.
AU  - Custer, A.X.
AU  - Erickson, M.Y.
AU  - Fischer, W.
AU  - McIntyre, G.T.
AU  - Poole, H.J.
AU  - Verdú-Andrés, S.
ED  - Boland, Mark
ED  - Tanaka, Hitoshi
ED  - Button, David
ED  - Dowd, Rohan
ED  - Schaa, Volker RW
ED  - Tan, Eugene
TI  - Novel Technique Ion Assisted In-Situ Coating of Long, Small Diameter, Accelerator Beam Pipes with Compacted Thick Crystalline Copper Film
J2  - Proc. of IPAC2019, Melbourne, Australia, 19-24 May 2019
CY  - Melbourne, Australia
T2  - International Particle Accelerator Conference
T3  - 10
LA  - english
AB  - Although great progress was made with in-situ copper coating, by magnetron sputtering, to address the high room temperature resistivity, literature indicates that conventionally deposited thick copper films do not retain the same RF conductivity at cryogenic temperatures, since straightforward deposition tends to result in films with columnar structure and other lattice defects, which cause significant conductivity degradation at cryogenic temperatures. We utilize energetic ions for ion assisted deposition (IAD) to reduce lattice imperfections, for coating. IAD that can in-situ coat long small diameter tubes with compacted crystalline structure thick copper films has been developed. Moreover, development of techniques and devices can resurrect IAD for other applications, which have been impractical and/or not viable economically. Comparison of conductivity at cryogenic temperatures between straight magnetron physical vapor deposition and IAD will be presented.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 4301
EP  - 4303
KW  - cathode
KW  - lattice
KW  - cryogenics
KW  - vacuum
KW  - plasma
DA  - 2019/06
PY  - 2019
SN  - 978-3-95450-208-0
DO  - DOI: 10.18429/JACoW-IPAC2019-THPTS080
UR  - http://jacow.org/ipac2019/papers/thpts080.pdf
ER  -