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RIS citation export for SUSPFO054: Design of the Condenser System and Imaging System for a UEM

TY  - CONF
AU  - Chen, T.
AU  - Li, W.
AU  - Pei, Y.J.
ED  - Boland, Mark
ED  - Tanaka, Hitoshi
ED  - Button, David
ED  - Dowd, Rohan
ED  - Schaa, Volker RW
ED  - Tan, Eugene
TI  - Design of the Condenser System and Imaging System for a UEM
J2  - Proc. of IPAC2019, Melbourne, Australia, 19-24 May 2019
CY  - Melbourne, Australia
T2  - International Particle Accelerator Conference
T3  - 10
LA  - english
AB  - The ultrafast electron microscope provides a useful tool for exploring fine structure and observing dynamic process at nanometer and picosecond scale, which has been extensively applied in chemistry and biological field. After emitting from the electron gun, electron beams are focused on the stage sample by the condenser system and then be projected by the imaging system on the screen. In the present study, a two-lens condenser system is simulated by Parmela and a three-lens imaging system is designed using thin-lens approximation. Besides, the shape factor of metallic spheres which have different radius for perturbation method is measured, which is conductive to measuring the Z/Q parameter and the electric field along the axis of the C-band 3MeV photocathode gun for the UEM.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 3485
EP  - 3487
DA  - 2019/06
PY  - 2019
SN  - 978-3-95450-208-0
DO  - DOI: 10.18429/JACoW-IPAC2019-THPMP016
UR  - http://jacow.org/ipac2019/papers/thpmp016.pdf
ER  -