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RIS citation export for WEPAF025: Fast Intensity Monitor Based on Channeltron Electron Multiplier

TY - CONF
AU - Calvi, G.M.A.
AU - Lante, V.
AU - Lanzavecchia, L.
AU - Magro, G.
AU - Parravicini, A.
AU - Rojatti, E.
AU - Viviani, C.
ED - Koscielniak, Shane
ED - Satogata, Todd
ED - Schaa, Volker RW
ED - Thomson, Jana
TI - Fast Intensity Monitor Based on Channeltron Electron Multiplier
J2 - Proc. of IPAC2018, Vancouver, BC, Canada, April 29-May 4, 2018
C1 - Vancouver, BC, Canada
T2 - International Particle Accelerator Conference
T3 - 9
LA - english
AB - The paper concerns the Fast Intensity Monitor (FIM) designed for the CNAO (Centro Nazionale di Adroterapia Oncologica), the Italian facility of Oncological Hadrontherapy. The FIM detector has been designed with the purpose of having a continuous and non-destructive measurement of the beam intensity in the High Energy Beam Transfer (HEBT) line. The passage of the beam through a thin aluminum foil produces secondary electrons whose yield depends on beam species (protons or carbon ions), intensity and energy. Secondary electrons are focused on the Channeltron Electron Multiplier (CEM) input, multiplied and sensed over a precision resistor. In order to minimize the perturbation to the beam, the foil is grounded and the read out electronics is floating. This makes electronics design harder but it is a key point to make FIM use possible continuously even during patients treatment. Measurements performed with the FIM are discussed and checked against reference detectors.
PB - JACoW Publishing
CP - Geneva, Switzerland
SP - 1873
EP - 1876
KW - electron
KW - electronics
KW - proton
KW - high-voltage
KW - detector
DA - 2018/06
PY - 2018
SN - 978-3-95450-184-7
DO - 10.18429/JACoW-IPAC2018-WEPAF025
UR - http://jacow.org/ipac2018/papers/wepaf025.pdf
ER -