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TY - CONF AU - Ye, H. AU - Fallahi, A. AU - Kärtner, F.X. AU - Küpper, J. AU - Muecke, O. AU - Rossi, G.M. AU - Trippel, S. T. ED - Koscielniak, Shane ED - Satogata, Todd ED - Schaa, Volker RW ED - Thomson, Jana TI - Characterization of Polarization-Dependent Emittance From an Array of Au Nanorods using Velocity Map Imaging Spectrometer J2 - Proc. of IPAC2018, Vancouver, BC, Canada, April 29-May 4, 2018 C1 - Vancouver, BC, Canada T2 - International Particle Accelerator Conference T3 - 9 LA - english AB - Electron beams of high quality, e.g., low emittance, are of crucial importance for cutting-edge scientific instruments, such as x-ray free electron lasers (XFELs) and ultrafast electron diffraction (UED) setups. A velocity-map-imaging (VMI) spectrometer was implemented to characterize the intrinsic root-mean-square (rms) normalized emittance from photocathodes. The spectrometer operated in both, spatial map imaging (SMI) and VMI modes. Therefore, spatial- and velocity-coordinates were recorded independently and quickly. The technique allows for fast complete emittance measurements, within minutes. A 75 μm pitch array of Au nanorods of dimension 100×30~nm, was studied under strong-field-emission regime by 100 fs 1 kHz 1.3 μm laser pulses with a 300×30 μm² focus spot size on the sample. A patterned electron bunch was observed, each emitted from a single nanorod within the array. A polarization dependent photoemission study was performed showing a smaller rms-normalized divergence of 0.8 mrad with the laser polarization normal to the sample surface, compared to 1.15 mrad for the parallel case. PB - JACoW Publishing CP - Geneva, Switzerland SP - 1612 EP - 1614 KW - electron KW - laser KW - polarization KW - emittance KW - experiment DA - 2018/06 PY - 2018 SN - 978-3-95450-184-7 DO - 10.18429/JACoW-IPAC2018-TUPML031 UR - http://jacow.org/ipac2018/papers/tupml031.pdf ER -