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TY - CONF AU - Zhang, N. AU - Chen, F.Z. AU - Zhou, Y.M. ED - Koscielniak, Shane ED - Satogata, Todd ED - Schaa, Volker RW ED - Thomson, Jana TI - Filling Pattern Measurement System Upgrade in SSRF* J2 - Proc. of IPAC2018, Vancouver, BC, Canada, April 29-May 4, 2018 C1 - Vancouver, BC, Canada T2 - International Particle Accelerator Conference T3 - 9 LA - english AB - Filling pattern affects various operation performance of a synchrotron light source. A new diagnostic beam charge monitor (BCM) with high bandwidth multi-channels digitizer was developed to perform bunch-by-bunch charge measurement and record filling pattern for SSRF storage ring. Signals picked up from button elec-trodes were sampled synchronously with RF frequency, and IQ (In-phase and Quadrature phase) sampling meth-od was employed for noise-filtering and phase independ-ence calibration. Layout and evaluation experiment of the system are presented in this paper. PB - JACoW Publishing CP - Geneva, Switzerland SP - 4791 EP - 4793 KW - operation KW - storage-ring KW - SRF KW - synchrotron KW - injection DA - 2018/06 PY - 2018 SN - 978-3-95450-184-7 DO - 10.18429/JACoW-IPAC2018-THPML066 UR - http://jacow.org/ipac2018/papers/thpml066.pdf ER -