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TY - CONF AU - Lee, S.J. AU - Han, J.H. AU - Kim, D.E. ED - Koscielniak, Shane ED - Satogata, Todd ED - Schaa, Volker RW ED - Thomson, Jana TI - Elliptically Polarizing Undulator Design for PAL-XFEL J2 - Proc. of IPAC2018, Vancouver, BC, Canada, April 29-May 4, 2018 C1 - Vancouver, BC, Canada T2 - International Particle Accelerator Conference T3 - 9 LA - english AB - Elliptically polarizing undulator (EPU) is under consideration as after-burner for the PAL-XFEL soft X-ray beamline to control the FEL polarization. In the soft X-ray line, seven planar undulators with a 35 mm period and 5 m length are in operation. To provide a polarization control of the FEL in the 1 to 3 nm wavelength, we compare the two types of EPUs, APPLE-II, and APPLE-X. The K value ranges for various operation modes are numerically studied for two undulator periods, 35 and 40 mm, of these EPU types. PB - JACoW Publishing CP - Geneva, Switzerland SP - 4362 EP - 4365 KW - undulator KW - FEL KW - controls KW - operation KW - electron DA - 2018/06 PY - 2018 SN - 978-3-95450-184-7 DO - 10.18429/JACoW-IPAC2018-THPMK031 UR - http://jacow.org/ipac2018/papers/thpmk031.pdf ER -