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RIS citation export for MOPML030: Demonstration of a Tunable Electron Beam Chopper for Application in 200 kV stroboscopic TEM

TY - CONF
AU - Jing, C.-J.
AU - Baryshev, S.V.
AU - Kanareykin, A.
AU - Lau, J.W.
AU - Liu, A.
AU - Masiel, D.
AU - Reed, B.
AU - Zhao, Y.
AU - Zhu, Y.
ED - Koscielniak, Shane
ED - Satogata, Todd
ED - Schaa, Volker RW
ED - Thomson, Jana
TI - Demonstration of a Tunable Electron Beam Chopper for Application in 200 kV stroboscopic TEM
J2 - Proc. of IPAC2018, Vancouver, BC, Canada, April 29-May 4, 2018
C1 - Vancouver, BC, Canada
T2 - International Particle Accelerator Conference
T3 - 9
LA - english
AB - For the last several decades, time-resolved transmission electron microscopes (TEM) exploring the sub-microsecond timescale have relied on the photoemission technology to generate the single or train of electron bunches. However, the complexity of additional laser system and the availability of high repitition rate laser limit applications of the laser-driven approach. Lately we have made substantial progress towards pioneering a new kind of time-resolved TEM, complementary to the existing laser-based techniques. Using a tunable RF beam-chopper, we are able to retrofit an exsiting TEM providing a pulsed electron beam at a continuously tunable reptition rate up to 12GHz and a tunable bunch length. In the article we will briefly discuss the working principle and experimental progress to date.
PB - JACoW Publishing
CP - Geneva, Switzerland
SP - 467
EP - 469
KW - electron
KW - kicker
KW - laser
KW - experiment
KW - controls
DA - 2018/06
PY - 2018
SN - 978-3-95450-184-7
DO - 10.18429/JACoW-IPAC2018-MOPML030
UR - http://jacow.org/ipac2018/papers/mopml030.pdf
ER -