Paper |
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THOAB03 |
Ultrafast Electron Microscopy using 100 Femtosecond Relativistic-Energy Electron Beam |
3183 |
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- J. Yang, K. Kan, K. Tanimura, Y. Yoshida
ISIR, Osaka, Japan
- J. Urakawa
KEK, Ibaraki, Japan
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An ultrafast detection technique on 100 fs time scales over sub-nanometer (even atomic) spatial dimensions has long been a goal for the scientists to reveal and understand the ultrafast structural-change induced dynamics in materials. In this paper, the generation of femtosecond electron pulses using the RF gun and the first prototype of femtosecond time-resolved relativistic-energy ultrafast electron microscopy (UEM) are reported. Finally, both relativistic-energy electron diffraction and image measurements in the UEM prototype are presented.
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