IPAC2016 - List of Authors (Perng, S.Y.)

Paper	Title	Page
MOPMR032	Measurement of Beam Size with a SR Interferometer in TPS	313
	M.L. Chen, H.C. Ho, K.H. Hsu, D.-G. Huang, C.K. Kuan, W.Y. Lai, C.J. Lin, S.Y. Perng, C.W. Tsai, T.C. Tseng, H.S. Wang NSRRC, Hsinchu, Taiwan
	Taiwan Photon Source (TPS) has operated since 2015. An optical diagnostic beamline is constructed in section 40 of TPS for the diagnosis of the properties of the electron beam. One instrument at this beamline is a synchrotron radiation interferometer (SRI), which is operated to monitor the beam size. In this paper, we present the beamline structure and recent results of measurement with the SR interferometer.
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WEPMR058	Survey and Alignment for Taiwan Photon Source Storage Ring	2405
	W.Y. Lai, M.L. Chen, H.C. Ho, K.H. Hsu, D.-G. Huang, C.K. Kuan, C.J. Lin, S.Y. Perng, C.W. Tsai, T.C. Tseng, H.S. Wang NSRRC, Hsinchu, Taiwan
	The Taiwan Photon Source (TPS) is a 3 Gev synchrotron light source located in Hsinchu, Taiwan. The commissioning of the beam began on December 2014, and the phase 1 stored current of 100mA was achieved on March 2015. Then the installation and alignment of insertion device were complete during the shutdown from April to July, and also the scheduled maintenance of survey control points was complete in the meantime. This report presents survey alignment results and experience of the TPS .
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THPMY014	Study of the Non-evaporable Ti-Zr-V Films Grown on Different Materials	3682
	L.H. Wu, C.M. Cheng, Y.T. Huang, S.Y. Perng, I.C. Sheng, C. Shueh NSRRC, Hsinchu, Taiwan
	The non-evaporable (NEG) Ti-Zr-V films were coated on the different vacuum-chamber materials, including the extruded aluminum samples (Al), the extruded seamless stainless steel samples (S.S.), CuCrZr alloys, and oxygen-free copper (OFC) plates. The NEG films were fabricated by using the direct current (DC) sputtering method. The secondary electron microscopy images showed that the morphology of NEG films was different on these various substrates. The thermal analysis (TA) presented that exothermic reaction happened by heating the samples.
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Paper

Title

Page

Measurement of Beam Size with a SR Interferometer in TPS

313

M.L. Chen, H.C. Ho, K.H. Hsu, D.-G. Huang, C.K. Kuan, W.Y. Lai, C.J. Lin, S.Y. Perng, C.W. Tsai, T.C. Tseng, H.S. Wang
NSRRC, Hsinchu, Taiwan

Taiwan Photon Source (TPS) has operated since 2015. An optical diagnostic beamline is constructed in section 40 of TPS for the diagnosis of the properties of the electron beam. One instrument at this beamline is a synchrotron radiation interferometer (SRI), which is operated to monitor the beam size. In this paper, we present the beamline structure and recent results of measurement with the SR interferometer.

Export •

reference for this paper to ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEPMR058

Survey and Alignment for Taiwan Photon Source Storage Ring

2405

W.Y. Lai, M.L. Chen, H.C. Ho, K.H. Hsu, D.-G. Huang, C.K. Kuan, C.J. Lin, S.Y. Perng, C.W. Tsai, T.C. Tseng, H.S. Wang
NSRRC, Hsinchu, Taiwan

The Taiwan Photon Source (TPS) is a 3 Gev synchrotron light source located in Hsinchu, Taiwan. The commissioning of the beam began on December 2014, and the phase 1 stored current of 100mA was achieved on March 2015. Then the installation and alignment of insertion device were complete during the shutdown from April to July, and also the scheduled maintenance of survey control points was complete in the meantime. This report presents survey alignment results and experience of the TPS .

Export •

reference for this paper to ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

THPMY014

Study of the Non-evaporable Ti-Zr-V Films Grown on Different Materials

3682

L.H. Wu, C.M. Cheng, Y.T. Huang, S.Y. Perng, I.C. Sheng, C. Shueh
NSRRC, Hsinchu, Taiwan

The non-evaporable (NEG) Ti-Zr-V films were coated on the different vacuum-chamber materials, including the extruded aluminum samples (Al), the extruded seamless stainless steel samples (S.S.), CuCrZr alloys, and oxygen-free copper (OFC) plates. The NEG films were fabricated by using the direct current (DC) sputtering method. The secondary electron microscopy images showed that the morphology of NEG films was different on these various substrates. The thermal analysis (TA) presented that exothermic reaction happened by heating the samples.

Export •

reference for this paper to ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)