Surface Characterization and Field Emission Measurements of Copper Samples inside a Scanning Electron Microscope

Ögren, Jim; Jafri, Syed Hassan Mujtaba; Leifer, Klaus; Ziemann, Volker

doi:10.18429/JACoW-IPAC2016-MOPMR023

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Text/Word citation export for MOPMR023: Surface Characterization and Field Emission Measurements of Copper Samples inside a Scanning Electron Microscope

J. Ögren, S.H.M. Jafri, K. Leifer, and V.G. Ziemann, “Surface Characterization and Field Emission Measurements of Copper Samples inside a Scanning Electron Microscope”, in Proc. 7th International Particle Accelerator Conference (IPAC'16), Busan, Korea, May 2016, paper MOPMR023, pp. 283-285, ISBN: 978-3-95450-147-2,
doi:10.18429/JACoW-IPAC2016-MOPMR023,
http://jacow.org/ipac2016/papers/mopmr023.pdf, 2016.