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@InProceedings{engblom:icalepcs2019-mocpl06,
author = {C. Engblom and Y.-M. Abiven and F. Alves and F. Berenguer and T. Bizien and A. Gibert and F. Langlois and A. Lestrade and P. Montaville and J. Pérez},
% author = {C. Engblom and Y.-M. Abiven and F. Alves and F. Berenguer and T. Bizien and A. Gibert and others},
% author = {C. Engblom and others},
title = {{2D-Nano-Ptychography Imaging Results on the SWING Beamline at Synchrotron SOLEIL}},
booktitle = {Proc. ICALEPCS'19},
pages = {91--96},
paper = {MOCPL06},
language = {english},
keywords = {controls, feedback, synchrotron, experiment, electron},
venue = {New York, NY, USA},
series = {International Conference on Accelerator and Large Experimental Physics Control Systems},
number = {17},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {08},
year = {2020},
issn = {2226-0358},
isbn = {978-3-95450-209-7},
doi = {10.18429/JACoW-ICALEPCS2019-MOCPL06},
url = {https://jacow.org/icalepcs2019/papers/mocpl06.pdf},
note = {https://doi.org/10.18429/JACoW-ICALEPCS2019-MOCPL06},
abstract = {A new Nanoprobe system, which was originally developed in the scope of a collaboration with MAXIV (Sweden), has recently been tested and validated on the SWING beamline in Synchrotron SOLEIL. The aim of the project was to construct a Ptychography nano-imaging station. Initial steps were taken to provide a portable system capable of nanometric scans of samples with sizes ranging from the micrometer to fractions of a millimeter. Imaging was made possible by actuating a total of 16 Degrees Of Freedom (DOF) composed of a sample stage (3 DOF), a central stop stage (5 DOF), a Fresnel zone plate stage (5 DOF), as well as an order sorting aperture stage (3 DOF). These stages were actuated by an ensemble of piezo-driven and high-quality brushless motors, of which synchronized control (with kinematic modelling) was done using the Delta Tau platform. In addition, interferometry feedback was used for reconstruction purposes. Imaging results are promising: the system was able to resolve 40 nm measured with a Siemens star, the paper will describe the system and the achieved results.},
}