Author: Ding, J.G.
Paper Title Page
TUPHA058 The Control Systems of SXFEL and DCLS 525
 
  • Y.B. Yan, G.H. Chen, J.G. Ding, S.M. Hu, Y.J. Liu, Q.R. Mi, H.F. Miao, C.L. Yu, H. Zhao, H.J. Zhu
    SSRF, Shanghai, People's Republic of China
 
  The high-gain free elec­tron lasers (FEL) have given sci­en­tists hopes for new sci­en­tific dis­cov­er­ies in many fron­tier re­search areas. The Shang­hai X-Ray Free-Elec­tron Laser (SXFEL) test fa­cil­ity is com­mis­sion­ing at the Shang­hai Syn­chro­tron Ra­di­a­tion Fa­cil­ity (SSRF) cam­pus. The Dalian Co­her­ent Light Source (DCLS) has suc­cess­fully com­mis­sioned in the north­east of China, which is the bright­est vac­uum ul­tra­vi­o­let (VUV) free elec­tron laser fa­cil­ity. The con­trol sys­tems of the two fa­cil­i­ties are base on EPICS. The in­dus­trial com­puter, pro­gram­ma­ble logic con­troller (PLC) and field pro­gram­ma­ble gate array (FPGA) are adopt for de­vice con­trol. The archiver is based on the Post­greSQL data­base. The high-level ap­pli­ca­tions are de­vel­oped using Python. The de­tails of the con­trol sys­tem de­sign, con­struc­tion and com­mis­sion­ing will be re­ported in this paper.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2017-TUPHA058  
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