University of Michigan, Ann Arbor, Michigan, USA
Integrated Sensors, LLC, Ottawa Hills, Ohio, USA
NSCL, East Lansing, Michigan, USA
A high performance Scintillator Ion Beam Monitor (SBM)provides diagnostics across a range of isotopes, energies, and intensities. It uses a machine-vision camera and a magazine of thin scintillators, movable into the beam without breaking vacuum. Two proprietary scintillators are used: a semicrystalline polymer material (PM) tested over a thickness range of ~1 to 190 µm. The PM yields stronger signals than other commercial plastic scintillators tested and is radiation damage resistant; a 100-400 µm opaque wafer consisting of inorganic crystals in a polymer hybrid matrix (HM). Both PM and HM are non-hygroscopic and produce minimal secondary reflections. HM produces significantly larger signals than CsI with excellent radiation damage resistance. The SBM was staged at the FRIB (East Lansing) ion beam, demonstrating real-time beam profile and rate analysis spanning more than five orders-of-magnitude including visualization of single ion signals with ~10-20 µm spatial resolution. It is superior to and may replace the reference detectors: Faraday cup, silicon strips and a CCD camera beam imager. A proton test beam extended the dynamic range by four orders-of-magnitude.
