IBIC2022 - List of Authors (Parsons França, L.)

Paper	Title	Page
WEP32	Secondary Emission Monitor Simulation, Measurements and Machine Learning Application Studies for CERN Fixed Target Beamlines	476
	L. Parsons França, M. Duraffourg, F. Roncarolo, F.M. Velotti CERN, Meyrin, Switzerland E. Kukstas, C.P. Welsch, H.D. Zhang The University of Liverpool, Liverpool, United Kingdom C.P. Welsch, H.D. Zhang Cockcroft Institute, Warrington, Cheshire, United Kingdom
	Funding: This work was supported by CERN and the STFC Liverpool Centre for Doctoral Training on Data Intensive Science (LIV. DAT) under grant agreement ST/P006752/1. The CERN fixed target experimental areas have recently acquired new importance thanks to newly proposed experiments, such as those linked to Physics Beyond Colliders (PBC) activities. Secondary Emission Monitors (SEMs) are the instruments currently used for measuring beam current, position and size in these areas. Guaranteeing their reliability, resistance to radiation and measurement precision is challenging. This paper presents the studies being conducted to understand ageing effects on SEM devices, to calibrate and optimise the SEM design for future use in these beamlines. These include feasibility studies for the application of machine learning techniques, with the objective of expanding the range of tools available for data analysis.
	Poster WEP32 [1.173 MB]
DOI •	reference for this paper ※ doi:10.18429/JACoW-IBIC2022-WEP32
About •	Received ※ 07 September 2022 — Revised ※ 10 September 2022 — Accepted ※ 13 September 2022 — Issue date ※ 02 October 2022
Cite •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

Secondary Emission Monitor Simulation, Measurements and Machine Learning Application Studies for CERN Fixed Target Beamlines

476

L. Parsons França, M. Duraffourg, F. Roncarolo, F.M. Velotti
CERN, Meyrin, Switzerland
E. Kukstas, C.P. Welsch, H.D. Zhang
The University of Liverpool, Liverpool, United Kingdom
C.P. Welsch, H.D. Zhang
Cockcroft Institute, Warrington, Cheshire, United Kingdom

Funding: This work was supported by CERN and the STFC Liverpool Centre for Doctoral Training on Data Intensive Science (LIV. DAT) under grant agreement ST/P006752/1.
The CERN fixed target experimental areas have recently acquired new importance thanks to newly proposed experiments, such as those linked to Physics Beyond Colliders (PBC) activities. Secondary Emission Monitors (SEMs) are the instruments currently used for measuring beam current, position and size in these areas. Guaranteeing their reliability, resistance to radiation and measurement precision is challenging. This paper presents the studies being conducted to understand ageing effects on SEM devices, to calibrate and optimise the SEM design for future use in these beamlines. These include feasibility studies for the application of machine learning techniques, with the objective of expanding the range of tools available for data analysis.

Poster WEP32 [1.173 MB]

DOI •

reference for this paper ※ doi:10.18429/JACoW-IBIC2022-WEP32

About •

Received ※ 07 September 2022 — Revised ※ 10 September 2022 — Accepted ※ 13 September 2022 — Issue date ※ 02 October 2022

Cite •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)