IBIC2022 - List of Authors (Ozkan Loch, C.)

Paper	Title	Page
MOP01	SLS 2.0 – Status of the Diagnostics	15
	C. Ozkan Loch, R. Ischebeck, N. Samadi, A.M.M. Stampfli, J. Vila Comamala PSI, Villigen PSI, Switzerland
	This poster will give an overview of the diagnostics development for SLS 2.0. Details on the beam size monitors in the storage ring, the screen monitors for the booster to ring transfer line, and beam loss monitors for the linac and storage ring will be presented. Test results carried out at the SLS will also be presented. BPMs and feedback systems are not covered in this contribution.
DOI •	reference for this paper ※ doi:10.18429/JACoW-IBIC2022-MOP01
About •	Received ※ 06 September 2022 — Revised ※ 13 September 2022 — Accepted ※ 18 September 2022 — Issue date ※ 01 December 2022
Cite •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WE1C2	An X-Ray Beam Property Analyzer Based on Dispersive Crystal Diffraction	366
	N. Samadi, G. Lovric, C. Ozkan Loch PSI, Villigen PSI, Switzerland X. Shi ANL, Lemont, Illinois, USA
	The advance in low-emittance x-ray sources urges the development of novel diagnostic techniques. Existing systems either have limited resolution or rely heavily on the quality of the optical system. An x-ray beam property analyzer based on a multi-crystal diffraction geometry was recently introduced. By measuring the transmitted beam profile of a dispersive Laue crystal downstream of a double-crystal monochromator, the system can provide a high-sensitivity characterization of spatial source properties, namely, size, divergence, position, and angle in the diffraction plane of the system at a single location in a beamline. In this work, we present the experimental validation at a super-bending magnet beamline at the Swiss Light Source and refine the method to allow for time-resolved characterization of the beam. Simulations are then carried out to show that the system is feasible to characterize source properties at undulator beamlines for fourth-generation light sources.

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	Slides WE1C2 [4.592 MB]
DOI •	reference for this paper ※ doi:10.18429/JACoW-IBIC2022-WE1C2
About •	Received ※ 08 September 2022 — Revised ※ 10 September 2022 — Accepted ※ 12 September 2022 — Issue date ※ 04 October 2022
Cite •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

SLS 2.0 – Status of the Diagnostics

15

C. Ozkan Loch, R. Ischebeck, N. Samadi, A.M.M. Stampfli, J. Vila Comamala
PSI, Villigen PSI, Switzerland

This poster will give an overview of the diagnostics development for SLS 2.0. Details on the beam size monitors in the storage ring, the screen monitors for the booster to ring transfer line, and beam loss monitors for the linac and storage ring will be presented. Test results carried out at the SLS will also be presented.
BPMs and feedback systems are not covered in this contribution.

DOI •

reference for this paper ※ doi:10.18429/JACoW-IBIC2022-MOP01

About •

Received ※ 06 September 2022 — Revised ※ 13 September 2022 — Accepted ※ 18 September 2022 — Issue date ※ 01 December 2022

Cite •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WE1C2

An X-Ray Beam Property Analyzer Based on Dispersive Crystal Diffraction

366

N. Samadi, G. Lovric, C. Ozkan Loch
PSI, Villigen PSI, Switzerland
X. Shi
ANL, Lemont, Illinois, USA

The advance in low-emittance x-ray sources urges the development of novel diagnostic techniques. Existing systems either have limited resolution or rely heavily on the quality of the optical system. An x-ray beam property analyzer based on a multi-crystal diffraction geometry was recently introduced. By measuring the transmitted beam profile of a dispersive Laue crystal downstream of a double-crystal monochromator, the system can provide a high-sensitivity characterization of spatial source properties, namely, size, divergence, position, and angle in the diffraction plane of the system at a single location in a beamline. In this work, we present the experimental validation at a super-bending magnet beamline at the Swiss Light Source and refine the method to allow for time-resolved characterization of the beam. Simulations are then carried out to show that the system is feasible to characterize source properties at undulator beamlines for fourth-generation light sources.

please see instructions how to view/control embeded videos

Slides WE1C2 [4.592 MB]

DOI •

reference for this paper ※ doi:10.18429/JACoW-IBIC2022-WE1C2

About •

Received ※ 08 September 2022 — Revised ※ 10 September 2022 — Accepted ※ 12 September 2022 — Issue date ※ 04 October 2022

Cite •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)