Paper |
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MOP15 |
Development of Non-Invasive Calibration Software for Front End X-Ray Beam Position Monitors at Diamond Light Source, Oxfordshire, UK |
59 |
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- C.E. Houghton, C. Bloomer, L. Bobb
DLS, Oxfordshire, United Kingdom
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Tungsten blade based photoemission X-ray Beam Position Monitors (XBPMs) are widely used as white beam diagnostics at synchrotrons. Traditionally, the scale factors are determined by stepper motor movements of the XBPM, or by controlled electron beam displacements, and measuring the response. These measurements must be repeated for each ID gap to produce a complete set of scale factors for all operational conditions. This calibration procedure takes time and cannot be done while users are acquiring data. In addition, the scale factors can vary over time due to changes to the storage ring. It is possible for these scale factors to become inaccurate, reducing the accuracy of the beam position measured by the XBPMs. By using the intrinsic kHz electron beam movements and correlating the signals from electron beam position monitors and XBPMs it is possible to have a real-time calculation of the scale factors without the need to disturb user operation. Presented in this paper is a method to non-invasively calculate scale factors during normal user operation. A comparison of the precision of this method versus the traditional stepper motor method is presented.
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DOI • |
reference for this paper
※ doi:10.18429/JACoW-IBIC2022-MOP15
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About • |
Received ※ 07 September 2022 — Revised ※ 10 September 2022 — Accepted ※ 11 September 2022 — Issue date ※ 17 October 2022 |
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WEP15 |
XFEL Photon Pulse Measurement Using an All-Carbon Diamond Detector |
416 |
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- C. Bloomer, L. Bobb
DLS, Oxfordshire, United Kingdom
- W. Freund, J. Grünert, J. Liu
EuXFEL, Schenefeld, Germany
- M.E. Newton
University of Warwick, Coventry, United Kingdom
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The European XFEL can generate extremely intense, ultra-short X-ray pulses at MHz repetition rates. Single-crystal CVD diamond detectors have been used to transparently measure the photon beam position and pulse intensity. The diamond itself can withstand the power of the beam, but the surface electrodes can be damaged since a single pulse can already exceed the damage threshold of the electrode material. Presented in this work are pulse intensity and position measurements obtained at the European XFEL using a new type of all-carbon single-crystal diamond detector developed at Diamond Light Source. Instead of traditional surface metallisation, the detector uses laser-written graphitic electrodes buried within the bulk diamond. There is no metallisation in the XFEL X-ray beam path that could be damaged by the beam. The results obtained from a prototype detector are presented, capable of measuring the intensity and 1-dimensional X-ray beam position of individual XFEL pulses. These successful measurements demonstrate the feasibility of all-carbon diagnostic detectors for XFEL use.
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DOI • |
reference for this paper
※ doi:10.18429/JACoW-IBIC2022-WEP15
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|
About • |
Received ※ 07 September 2022 — Revised ※ 10 September 2022 — Accepted ※ 12 September 2022 — Issue date ※ 23 September 2022 |
Cite • |
reference for this paper using
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※ LaTeX,
※ Text/Word,
※ RIS,
※ EndNote (xml)
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