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TY - CONF AU - Shiltsev, V.D. ED - Kim, Changbum ED - Schaa, Volker R. W. ED - Kim, Dong-Eon ED - Lee, Jaeyu TI - Space-Charge and Other Effects in Fermilab Booster and IOTA Rings’ Ionization Profile Monitors J2 - Proc. of IBIC2021, Pohang, Rep. of Korea, 24-28 May 2021 CY - Pohang, Rep. of Korea T2 - International Beam Instrumentation Conference T3 - 10 LA - english AB - Ionization profile monitors (IPMs) are widely used in accelerators for non-destructive and fast diagnostics of high energy particle beams. At low beam intensities, initial velocities of the secondaries to collect (ions or electrons) result in the IPM profile smearing. At high beam intensities, the space-charge forces make the measured IPM profiles significantly different from those of the beams. We analyze dynamics of the secondaries in IPMs, describe an effective algorithm to reconstruct the beam sizes from the measured IPM profiles and apply it to the Fermilab 8 GeV proton Booster and 70 MeV/c IOTA ring IPMs. PB - JACoW Publishing CP - Geneva, Switzerland SP - 193 EP - 197 KW - booster KW - proton KW - space-charge KW - electron KW - operation DA - 2021/10 PY - 2021 SN - 2673-5350 SN - 978-3-95450-230-1 DO - doi:10.18429/JACoW-IBIC2021-TUPP05 UR - https://jacow.org/ibic2021/papers/tupp05.pdf ER -