Single-Shot Diagnostics of Microbunched Electrons in Laser-Driven Plasma Accelerators and Free-Electron Lasers

Lumpkin, Alex; Rule, D.W.

doi:10.18429/JACoW-IBIC2019-WEPP039

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BiBTeX citation export for WEPP039: Single-Shot Diagnostics of Microbunched Electrons in Laser-Driven Plasma Accelerators and Free-Electron Lasers

@InProceedings{lumpkin:ibic2019-wepp039,
  author       = {A.H. Lumpkin and D.W. Rule},
  title        = {{Single-Shot Diagnostics of Microbunched Electrons in Laser-Driven Plasma Accelerators and Free-Electron Lasers}},
  booktitle    = {Proc. IBIC'19},
  pages        = {633--636},
  paper        = {WEPP039},
  language     = {english},
  keywords     = {laser, electron, diagnostics, radiation, bunching},
  venue        = {Malmö, Sweden},
  series       = {International Beam Instrumentation Conferenc},
  number       = {8},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {nov},
  year         = {2019},
  issn         = {2673-5350},
  isbn         = {978-3-95450-204-2},
  doi          = {10.18429/JACoW-IBIC2019-WEPP039},
  url          = {http://jacow.org/ibic2019/papers/wepp039.pdf},
  note         = {https://doi.org/10.18429/JACoW-IBIC2019-WEPP039},
}