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TY - CONF AU - Bobb, L. AU - Rehm, G. ED - Schaa, Volker RW ED - Jansson, Andreas ED - Shea, Thomas ED - Olander, Johan TI - Spatial Resolution of an X-ray Pinhole Camera using a Multi-layer Monochromator J2 - Proc. of IBIC2019, Malmö, Sweden, 08-12 September 2019 CY - Malmö, Sweden T2 - International Beam Instrumentation Conferenc T3 - 8 LA - english AB - X-ray pinhole cameras are widely used for beam emittance monitoring at synchrotron light sources. Due to the reduction in beam emittance expected for the many fourth generation machine upgrades, the spatial resolution of the pinhole camera must be improved accordingly. It is well known that there are many contributions to the point spread function. However, a significant contribution arises from diffraction by the pinhole aperture. Given that diffraction is dependent on the spectral distribution of the incident synchrotron radiation, the spatial resolution can be improved by using a monochromatic beam. For optimal performance, the photon energy should be matched to the pinhole aperture size. Here we investigate the spatial resolution of the pinhole camera as a function of photon energy using a multi-layer monochromator. PB - JACoW Publishing CP - Geneva, Switzerland SP - 417 EP - 419 KW - photon KW - emittance KW - simulation KW - synchrotron KW - feedback DA - 2019/11 PY - 2019 SN - 2673-5350 SN - 978-3-95450-204-2 DO - doi:10.18429/JACoW-IBIC2019-TUPP038 UR - http://jacow.org/ibic2019/papers/tupp038.pdf ER -