A Study of the Effect of Imperfections in the Optical Path of the SNS* Target Imaging System Using a Mock-up

Blokland, Willem; Garcia, Francis

doi:10.18429/JACoW-IBIC2017-WEPCC14

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Text/Word citation export for WEPCC14: A Study of the Effect of Imperfections in the Optical Path of the SNS* Target Imaging System Using a Mock-up

W. Blokland, F.G. Garcia, “A Study of the Effect of Imperfections in the Optical Path of the SNS* Target Imaging System Using a Mock-up”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, paper WEPCC14, pp. 384-387, ISBN: 978-3-95450-192-2, https://doi.org/10.18429/JACoW-IBIC2017-WEPCC14, 2018.