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TY - CONF AU - Meigo, S.I. AU - Takei, H. ED - Liu, Zhengzheng ED - Lidia, Steven ED - McCausey, Amy ED - Schaa, Volker RW TI - Profile Monitor on Target for Spallation Neutron Source J2 - Proc. of IBIC2017, Grand Rapids, MI, USA, 20-24 August 2017 C1 - Grand Rapids, MI, USA T2 - International Beam Instrumentation Conference T3 - 6 LA - english AB - For a high power hadron accelerator facilities such as spallation neutron source in J-PARC (JSNS) and material test facility for ADS called TEF-T, the beam profile monitor is essential. To diagnostic property of the proton beam introduced to the target, a multi-wire profile monitor (MWPM) was utilized, by which one -dimensional profile can be obtained. Since the nonlinear optics is employed to decrease peak current density at the target, two-dimensional information is required. To obtain a two-dimensional profile, we have been developing a new profile monitor based on the luminescence material. Since degradation of luminescence is concerned, which is observed at the SNS monitor system, an experiment was performed by using Al2O3 doped Cr material irradiated with Ar ion beam having the energy of 150 MeV at cyclotron facility in TIARA. During irradiation, degradation of the light yield of luminance was observed. For the development of the monitor less degradation of luminescence, other materials such as Y2O3 irradiation is planned. PB - JACoW CP - Geneva, Switzerland SP - 373 EP - 376 KW - ion KW - target KW - proton KW - radiation KW - neutron DA - 2018/03 PY - 2018 SN - 978-3-95450-192-2 DO - 10.18429/JACoW-IBIC2017-WEPCC11 UR - http://jacow.org/ibic2017/papers/wepcc11.pdf ER -