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RIS citation export for WEPCC07: A Modular Application for IPM Simulations

TY - CONF
AU - Vilsmeier, D.M.
AU - Forck, P.
AU - Sapinski, M.
ED - Liu, Zhengzheng
ED - Lidia, Steven
ED - McCausey, Amy
ED - Schaa, Volker RW
TI - A Modular Application for IPM Simulations
J2 - Proc. of IBIC2017, Grand Rapids, MI, USA, 20-24 August 2017
C1 - Grand Rapids, MI, USA
T2 - International Beam Instrumentation Conference
T3 - 6
LA - english
AB - Simulating the electron and ion tracking in Ionization Profile Monitors is an important tool for specifying and designing new monitors. It is also essential for understanding the effects related to the ionization process, guiding field non-uniformities and influence of the beam fields which may lead to a distortion of measured profiles. Existing simulation codes are often tuned to the specific needs of a laboratory, are not well documented and lack a practical user interface. This work presents a generic simulation tool which combines the features of existing codes in order to provide a common standard for IPM simulations. The modular structure of the application allows for exchanging the computational modules depending on the use case and makes it extensible to new use cases. By this means simulations of Beam Induced Fluorescence monitors based on supersonic gas jets have been realized. The application and all involved methods have been tested and benchmarked against existing results. The code is well documented and includes a graphical user interface. It is publicly available as a git repository and as a Python package.
PB - JACoW
CP - Geneva, Switzerland
SP - 355
EP - 358
KW - ion
KW - simulation
KW - electron
KW - proton
KW - GUI
DA - 2018/03
PY - 2018
SN - 978-3-95450-192-2
DO - 10.18429/JACoW-IBIC2017-WEPCC07
UR - http://jacow.org/ibic2017/papers/wepcc07.pdf
ER -