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RIS citation export for TUPCC18: Beam Arrival Time Measurement at SXFEL

TY - CONF
AU - Cao, S.S.
AU - Chen, J.
AU - Leng, Y.B.
AU - Yuan, R.X.
ED - Liu, Zhengzheng
ED - Lidia, Steven
ED - McCausey, Amy
ED - Schaa, Volker RW
TI - Beam Arrival Time Measurement at SXFEL
J2 - Proc. of IBIC2017, Grand Rapids, MI, USA, 20-24 August 2017
C1 - Grand Rapids, MI, USA
T2 - International Beam Instrumentation Conference
T3 - 6
LA - english
AB - Shanghai Soft X-ray Free Electron Laser (SXFEL) is a fourth-generation light source which could provide coherent X-rays for various scientific researches. One of the key issues of its operation is the measurement of bunch arrival time which is important for the synchronization of a bunch and seeded laser. The measurement utilized a newly designed beam arrival time monitor (BAM) which contains two cavities at a different frequency. Thus a new way, dual-cavities mixing method, is applied in this experiment to evaluate the beam arrival time resolution. In this paper, we presented the scheme and different measured resolution of various measurement methods and evaluated the stability of the new monitor.
PB - JACoW
CP - Geneva, Switzerland
SP - 193
EP - 195
KW - ion
KW - cavity
KW - FEL
KW - pick-up
KW - experiment
DA - 2018/03
PY - 2018
SN - 978-3-95450-192-2
DO - 10.18429/JACoW-IBIC2017-TUPCC18
UR - http://jacow.org/ibic2017/papers/tupcc18.pdf
ER -