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TY - CONF AU - Wang, J. AU - Mihalcea, D. AU - Piot, P. ED - Liu, Zhengzheng ED - Lidia, Steven ED - McCausey, Amy ED - Schaa, Volker RW TI - Time-Resolved Electron-Bunch Diagnostics Using Transverse Wakefields J2 - Proc. of IBIC2017, Grand Rapids, MI, USA, 20-24 August 2017 C1 - Grand Rapids, MI, USA T2 - International Beam Instrumentation Conference T3 - 6 LA - english AB - The development of future free electron lasers (FELs) requires reliable time-resolved measurement of variable ultra-short electron-bunchs characteristics. A possible technique is to streak the bunch in the transverse direction by means of time-dependent external fields. In this paper we explore the possible use of self-generated electromagnetic fields *. A passive deflector, consisting of a dielectric-lined waveguide, is used to produce wakefields that impart a time-dependent transverse kick to the relativistic electron bunch passing off-axis. We investigate the technique and its performances and explore its possible application at the Fermilab Accelerator Science & Technology (FAST) facility. PB - JACoW CP - Geneva, Switzerland SP - 172 EP - 175 KW - ion KW - electron KW - cavity KW - wakefield KW - GUI DA - 2018/03 PY - 2018 SN - 978-3-95450-192-2 DO - 10.18429/JACoW-IBIC2017-TUPCC10 UR - http://jacow.org/ibic2017/papers/tupcc10.pdf ER -