Improving the Sensitivity of Existing Electro-Optic Sampling Setups by Adding Brewster Plates: Tests of the Strategy at SOLEIL

Bielawski, Serge; Brubach, Jean-Blaise; Evain, Clement; Le Parquier, Marc; Manceron, Laurent; Roy, Pascale; Szwaj, Christophe; Tordeux, Marie-Agnès

doi:10.18429/JACoW-IBIC2017-TUPCC08

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BiBTeX citation export for TUPCC08: Improving the Sensitivity of Existing Electro-Optic Sampling Setups by Adding Brewster Plates: Tests of the Strategy at SOLEIL

@InProceedings{Bielawski:IBIC2017-TUPCC08,
  author       = {S. Bielawski and others},
  title        = {{I}mproving the {S}ensitivity of {E}xisting {E}lectro{-O}ptic {S}ampling {S}etups by {A}dding {B}rewster {P}lates: {T}ests of the {S}trategy at {SOLEIL}},
  booktitle    = {Proc. of International Beam Instrumentation Conference (IBIC'17),
                  Grand Rapids, MI, USA, 20-24 August 2017},
  pages        = {164--167},
  paper        = {TUPCC08},
  language     = {english},
  keywords     = {ion, laser, photon, electron, operation},
  venue        = {Grand Rapids, MI, USA},
  series       = {International Beam Instrumentation Conference},
  number       = {6},
  publisher    = {JACoW},
  address      = {Geneva, Switzerland},
  month        = {Mar.},
  year         = {2018},
  isbn         = {978-3-95450-192-2},
  doi          = {https://doi.org/10.18429/JACoW-IBIC2017-TUPCC08},
  url          = {http://jacow.org/ibic2017/papers/tupcc08.pdf},
  note         = {https://doi.org/10.18429/JACoW-IBIC2017-TUPCC08},
}