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TY - CONF AU - Marques, S.R. ED - Liu, Zhengzheng ED - Lidia, Steven ED - McCausey, Amy ED - Schaa, Volker RW TI - Beam Diagnostics Systems for Sirius Light Source J2 - Proc. of IBIC2017, Grand Rapids, MI, USA, 20-24 August 2017 C1 - Grand Rapids, MI, USA T2 - International Beam Instrumentation Conference T3 - 6 LA - english AB - This paper gives an overview of Sirius diagnostics systems under commissioning or in planning phase. It includes beam position monitors for electron and photon beams, visible and X-ray synchrotron light monitors, transverse profile monitors, streak camera, beam loss monitors, current monitors, charge monitors, tune and filling pattern measurements. The paper focuses on the specification of the beam diagnostics systems and their motivation, parts selection, accompanying data acquisition systems, control software capabilities and development status. PB - JACoW CP - Geneva, Switzerland SP - 89 EP - 93 KW - ion KW - EPICS KW - controls KW - electron KW - storage-ring DA - 2018/03 PY - 2018 SN - 978-3-95450-192-2 DO - 10.18429/JACoW-IBIC2017-MOPCF09 UR - http://jacow.org/ibic2017/papers/mopcf09.pdf ER -