Author: Huang, X.
Paper Title Page
MOPG70 Transverse Beam Profiling and Vertical Emittance Control with a Double-Slit Stellar Interferometer 236
 
  • W.J. Corbett, X. Huang, J. Wu
    SLAC, Menlo Park, California, USA
  • C.L. Li, W.J. Zhang
    East China University of Science and Technology, Shanghai, People's Republic of China
  • T.M. Mitsuhashi
    KEK, Ibaraki, Japan
  • Y.H. Xu
    DongHua University, Songjiang, People's Republic of China
  • W.J. Zhang
    University of Saskatchewan, Saskatoon, Canada
  
  Double-slit interferometers are useful tools to measure the transverse the cross-section of relativistic charged particle beams emitting incoherent synchrotron radiation. By rotating the double-slit about the beam propagation axis, the transverse beam profile can be reconstructed including beam tilt at the source. The interferometer can also be used as a sensitive monitor for vertical emittance control. In this paper we outline a simple derivation of the Van Cittert-Zernike theorem, present results for a rotating double-slit measurement and demonstrate application of the interferometer to vertical emittance control using the Robust Conjugate Direction Search (RCDS) optimization algorithm.  
poster icon Poster MOPG70 [1.362 MB]  
DOI • reference for this paper ※ DOI:10.18429/JACoW-IBIC2016-MOPG70  
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