Non-Invasive Beam Profile Measurement for High Intensity Electron Beams

Weilbach, Tobias; Aulenbacher, Kurt; Bruker, Max-Wilhelm

doi:10.18429/JACoW-IBIC2016-WEPG67

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BiBTeX citation export for WEPG67: Non-Invasive Beam Profile Measurement for High Intensity Electron Beams

@InProceedings{Weilbach:IBIC2016-WEPG67,
  author       = {T. Weilbach and K. Aulenbacher and M.W. Bruker},
  title        = {{N}on{-I}nvasive {B}eam {P}rofile {M}easurement for {H}igh {I}ntensity {E}lectron {B}eams},
  booktitle    = {Proc. of International Beam Instrumentation Conference (IBIC'16),
                  Barcelona, Spain, Sept. 13-18, 2016},
  pages        = {804--807},
  paper        = {WEPG67},
  language     = {english},
  keywords     = {electron, laser, photon, background, detector},
  venue        = {Barcelona, Spain},
  series       = {International Beam Instrumentation Conference},
  number       = {5},
  publisher    = {JACoW},
  address      = {Geneva, Switzerland},
  month        = {Feb.},
  year         = {2017},
  isbn         = {978-3-95450-177-9},
  doi          = {doi:10.18429/JACoW-IBIC2016-WEPG67},
  url          = {http://jacow.org/ibic2016/papers/wepg67.pdf},
  note         = {doi:10.18429/JACoW-IBIC2016-WEPG67},
}