Calibration of X-ray Monitor during the Phase I of SuperKEKB commissioning

Mulyani, Emy; Flanagan, John

doi:10.18429/JACoW-IBIC2016-TUPG72

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BiBTeX citation export for TUPG72: Calibration of X-ray Monitor during the Phase I of SuperKEKB commissioning

@InProceedings{Mulyani:IBIC2016-TUPG72,
  author       = {E. Mulyani and J.W. Flanagan},
  title        = {{C}alibration of {X-}ray {M}onitor during the {P}hase {I} of {S}uper{KEKB} commissioning},
  booktitle    = {Proc. of International Beam Instrumentation Conference (IBIC'16),
                  Barcelona, Spain, Sept. 13-18, 2016},
  pages        = {525--528},
  paper        = {TUPG72},
  language     = {english},
  keywords     = {emittance, factory, detector, scattering, optics},
  venue        = {Barcelona, Spain},
  series       = {International Beam Instrumentation Conference},
  number       = {5},
  publisher    = {JACoW},
  address      = {Geneva, Switzerland},
  month        = {Feb.},
  year         = {2017},
  isbn         = {978-3-95450-177-9},
  doi          = {doi:10.18429/JACoW-IBIC2016-TUPG72},
  url          = {http://jacow.org/ibic2016/papers/tupg72.pdf},
  note         = {doi:10.18429/JACoW-IBIC2016-TUPG72},
}