X-Ray Smith-Purcell Radiation for Non-Invasive Submicron Diagnostics of Electron Beams Having TeV Energy

Tishchenko, Alexey; Sergeeva, Daria

doi:10.18429/JACoW-IBIC2016-TUPG62

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BiBTeX citation export for TUPG62: X-Ray Smith-Purcell Radiation for Non-Invasive Submicron Diagnostics of Electron Beams Having TeV Energy

@InProceedings{Tishchenko:IBIC2016-TUPG62,
  author       = {A.A. Tishchenko and D.Yu. Sergeeva},
  title        = {{X-R}ay {S}mith{-P}urcell {R}adiation for {N}on{-I}nvasive {S}ubmicron {D}iagnostics of {E}lectron {B}eams {H}aving {T}e{V} {E}nergy},
  booktitle    = {Proc. of International Beam Instrumentation Conference (IBIC'16),
                  Barcelona, Spain, Sept. 13-18, 2016},
  pages        = {495--498},
  paper        = {TUPG62},
  language     = {english},
  keywords     = {radiation, target, diagnostics, electron, plasma},
  venue        = {Barcelona, Spain},
  series       = {International Beam Instrumentation Conference},
  number       = {5},
  publisher    = {JACoW},
  address      = {Geneva, Switzerland},
  month        = {Feb.},
  year         = {2017},
  isbn         = {978-3-95450-177-9},
  doi          = {doi:10.18429/JACoW-IBIC2016-TUPG62},
  url          = {http://jacow.org/ibic2016/papers/tupg62.pdf},
  note         = {doi:10.18429/JACoW-IBIC2016-TUPG62},
}