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The transverse particle beam emittance of a synchrotron light source is a crucial parameter because it is directly related to the brilliance of the emitted radiation. Therefore a precise online control of the beam profile which is typically in the order of a few 10–100 microns is highly desirable from which the corresponding emittance can be calculated. Due to its non-destructive nature synchrotron radiation is a versatile tool for beam profile measurements and is used in nearly every light source. While in principle synchrotron radiation from insertion devices or bending magnets can be utilized, in reality most light sources use bending magnet radiation based profile monitoring because of space limitations. There exist a number of different techniques in order to overcome limitations due to resolution broadening effects which may strongly affect the measured profiles. In this talk an overview over these methods will be given which are commonly applied in most of the present light sources.
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