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Roehrs, M.

Paper Title Page
THPP036 Measurement of Slice-Emmittance using Transverse Deflecting Structure 541
 
  • M. Roehrs, A. Bolzmann, M. Huening, H. Schlarb
    DESY, Hamburg
  • K. Honkavaara
    Uni HH, Hamburg
  
 

Among the very critical parameters for the operation of the VUV-FEL at DESY are the slice-emmittance and beam optics matching of the current peak in the electron bunch. Conventional tools for measuring the beam size are sensitive to the projected properties of the bunch only and hence suffer from mixing of different parts of the bunch. A combination of streaking with a transverse deflecting rf structure (LOLA) and a quadrupole scan allowed to measure the spike separate from the rest of the bunch. Indeed significant differences in terms of emmittance and optical functions have been found.