• J.Y. Huang, Y.S. Bae, M.-H. Chun, Y.J. Han, S.-H. Jeong, H.-S. Kang, D.T. Kim, S.H. Kim, S.-C. Kim, I.S. Ko, H.J. Park, I.-S. Park, S.J. Park, Y.J. Park, S.Y. Rah, J.-H. Suh
  PAL, Pohang, Kyungbuk
• J.H. Hong, C. Kim
  POSTECH, Pohang, Kyungbuk

Funding: Work supported by Ministry of Science and Technology (MOST)

Beam diagnostics for PAL-XFEL physics calls for precision of femto-second in time structure and sub-micrometer in beam position measurement(BPM). Existing instruments can be used for standard diagnostics such as single bunch charge measurement, wire scanner or optical transition radiator for beam size measurement. Instead, major R&D efforts should be focused on the measurement of femto-second bunch structure using electro-optic crystal, coherent radiation and transverse deflecting cavity. Nanometer BPM technique being developed in collaboration with linear collider group will also be utilized for sub-micrometer BPM. Overall plan and the ongoing R&D activities will be presented.