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Bae, Y.S.

Paper Title Page
MOPP044 Beam Diagnostic System for PAL-XFEL 146
 
  • J.Y. Huang, Y.S. Bae, M.-H. Chun, Y.J. Han, S.-H. Jeong, H.-S. Kang, D.T. Kim, S.H. Kim, S.-C. Kim, I.S. Ko, H.J. Park, I.-S. Park, S.J. Park, Y.J. Park, S.Y. Rah, J.-H. Suh
    PAL, Pohang, Kyungbuk
  • J.H. Hong, C. Kim
    POSTECH, Pohang, Kyungbuk
  
 

Funding: Work supported by Ministry of Science and Technology (MOST)

Beam diagnostics for PAL-XFEL physics calls for precision of femto-second in time structure and sub-micrometer in beam position measurement(BPM). Existing instruments can be used for standard diagnostics such as single bunch charge measurement, wire scanner or optical transition radiator for beam size measurement. Instead, major R&D efforts should be focused on the measurement of femto-second bunch structure using electro-optic crystal, coherent radiation and transverse deflecting cavity. Nanometer BPM technique being developed in collaboration with linear collider group will also be utilized for sub-micrometer BPM. Overall plan and the ongoing R&D activities will be presented.

  
   
MOPP046 Beam Transport Line Design for Emittance Adjustment PLS X-FEL 153
 
  • M. Kim, Y.S. Bae, J. Choi, H.-S. Kang, T.-Y. Lee
    PAL, Pohang, Kyungbuk
  
 

PLS W-FEL (1.2 GeV) and X-FEL (3.7 GeV) are designed to have large angle about 30 degree and 20 degree totally because of geometric restriction. This results in severe emittance growth. So PLS FEL BTL Design is focused to adjust emittance growth. This paper talks simulation results of emittance growth and another beam dynamic parameters.