At AIST, efforts to increase the FEL power as well as to shorten the lasing wavelength below 190 nm are being made, to use the NIJI-IV FEL as an intense light source for real-time surface observation using the photoelectron emission microscopy (PEEM). By irradiating a transition-metal surface with the 200-nm FEL, fine structure of one- micron scale was successfully observed with spatial and temporal resolutions of a few hundreds nm and 33 ms, respectively. In addition, a 3.6-m optical klystron for lasing in the infrared was recently installed into the north straight section of the NIJI-IV to extend the lasing wavelength range up to ~ 10 microns. One of our interests in the infrared-FEL application is to utilize it for a Raman spectroscopy which can examine adsorbed molecules and their bonding conditions on the metal surface. Establishment of a total surface analysis system using NIJI-IV compact VUV/IR FEL combined with characteristic surface analysis techniques is one of our goals in the near future. Improved performance of the NIJI-IV FEL obtained this year will be reported. Typical results of the PEEM measurement will be discussed.