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RIS citation export for TUT3AH0: Low SEY Engineered Surface for Electron Cloud Eradication

TY - UNPB
AU - Valizadeh, R.
AU - Cropper, M.D.
AU - Malyshev, O.B.
AU - Sian, B.S.
AU - Wang, S.
AU - Xia, G.X.
ED - Zhao, Ning
ED - Poole, John
ED - Schaa, Volker RW
TI - Low SEY Engineered Surface for Electron Cloud Eradication
J2 - Proc. of eeFACT2016, Daresbury, UK, October 24-27, 2016
C1 - Daresbury, UK
T2 - ICFA Advanced Beam Dynamics Workshop on High Luminosity Circular e^+e^- Colliders
T3 - 58
LA - english
AB - Developing a surface with low Secondary Electron Yield (SEY) is one of the principal methods of mitigating the beam-induced electron multipacting and electron cloud in high-energy charged particle accelerators. Since the wall material, surface chemistry, topography and electron energy are the parameters that influence the SEY, common mitigation mechanisms are based on engineering the above parameters. Recently ASTeC has demonstrated that nano- and microstructures engineered on Cu, Al and Stainless steel surface reduces SEY to less than 1. Such structures can be readily produced by nano- and sub-nanosecond pulsed laser. SEY can be further reduced to an even lower value by bake-out and/or photon and/or electron bombardment. A systematic analysis of surface composition and chemistry (using XPS), the surface topography (using SEM), and SEY measurements with primary electron energies ranging from 50 to 1000 eV is reported and correlated to the laser treatment conditions. A test liner was prepared by ASTeC for a first machine test of such new anti-e-cloud technique. The liner has been installed at SPS for testing in the LHC-like beam conditions.
PB - JACoW
CP - Geneva, Switzerland
ER -