ECRIS2016 - List of Authors (Nakagawa, T.)

Paper	Title	Page
MOBO04	Recent Developments of RIKEN 28 GHz SC-ECRIS	10
	Y. Higurashi, H. Haba, M. Kidera, T. Nakagawa, J. Ohnishi, K. Ozeki RIKEN Nishina Center, Wako, Japan
	In the past two years, we tried to improve the performance of the RIKEN 28GHz SC-ECRIS for production of intense U ion beam. Usually, we used the sputtering method to produce U ion beam. Last year, we produced ~200e μA of U³⁵⁺ at the injected RF power of ~2.6kW, when slightly adding the U vapor with high temperature oven. For RIKEN RIBF experiment, we produced ~110 e μA of U³⁵⁺ beam with sputtering method longer than one month without break. In this case, we surly need very stable beam to increase the transmission efficiency in the accelerators and avoid the any damage of the components of the accelerator due to the high power beam. In this contribution, we will report the beam intensity of highly charged U ions as a function of various parameters (magnetic field strength, RF power, sputtering voltage etc.) and the effect of these parameters on the beam stability in detail. We also present the experience of the long term operation of the ion source for the RIKEN RIBF experiments.
	Slides MOBO04 [3.427 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-ECRIS2016-MOBO04
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WEPP35	Four-Dimension Transverse Phase-Space Distribution Measured by a Pepper-Pot Emittance Meter	125
	T. Nagatomo, O. Kamigaito, M. Kase, T. Nakagawa RIKEN Nishina Center, Wako, Japan J.W. Stetson NSCL, East Lansing, Michigan, USA V. Tzoganis Cockcroft Institute, Warrington, Cheshire, United Kingdom
	Four-dimensional (4-D) transverse emittance of the highly charged heavy ion beam extracted from ECR ion source is invariant under linear 4-D symplectic operation. Thus, it is essential quantity to improve the beam quality. Measurement of the 4-D phase-space distribution provides quantitative and essential information to improve the efficiency of beam transport. We have developed an on-line pepper-pot-type emittance meter, which is a suitable device to obtain the 4-D phase-space distribution from an image of beamlets passing through the well-aligned pinholes. The emittance meter consists of a thin metal plate with a pinhole array, which is translated along the beam axis, and an imaging screen (P46) with a MCP. We optimized the analysis procedure to obtain the distribution so that the elapsed time of the process was shortened as less than 1 second, and which was enough short for on-line measurements. We will discuss the quality of the obtained 4-D distribution by comparing it with the one obtained from a simulation. Further, we will also discuss how the gas pressure of LEBT affects the 4-D distribution to establish to improve the beam brightness.
	Poster WEPP35 [2.753 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-ECRIS2016-WEPP35
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

Recent Developments of RIKEN 28 GHz SC-ECRIS

10

Y. Higurashi, H. Haba, M. Kidera, T. Nakagawa, J. Ohnishi, K. Ozeki
RIKEN Nishina Center, Wako, Japan

In the past two years, we tried to improve the performance of the RIKEN 28GHz SC-ECRIS for production of intense U ion beam. Usually, we used the sputtering method to produce U ion beam. Last year, we produced ~200e μA of U³⁵⁺ at the injected RF power of ~2.6kW, when slightly adding the U vapor with high temperature oven. For RIKEN RIBF experiment, we produced ~110 e μA of U³⁵⁺ beam with sputtering method longer than one month without break. In this case, we surly need very stable beam to increase the transmission efficiency in the accelerators and avoid the any damage of the components of the accelerator due to the high power beam. In this contribution, we will report the beam intensity of highly charged U ions as a function of various parameters (magnetic field strength, RF power, sputtering voltage etc.) and the effect of these parameters on the beam stability in detail. We also present the experience of the long term operation of the ion source for the RIKEN RIBF experiments.

Slides MOBO04 [3.427 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-ECRIS2016-MOBO04

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEPP35

Four-Dimension Transverse Phase-Space Distribution Measured by a Pepper-Pot Emittance Meter

125

T. Nagatomo, O. Kamigaito, M. Kase, T. Nakagawa
RIKEN Nishina Center, Wako, Japan
J.W. Stetson
NSCL, East Lansing, Michigan, USA
V. Tzoganis
Cockcroft Institute, Warrington, Cheshire, United Kingdom

Four-dimensional (4-D) transverse emittance of the highly charged heavy ion beam extracted from ECR ion source is invariant under linear 4-D symplectic operation. Thus, it is essential quantity to improve the beam quality. Measurement of the 4-D phase-space distribution provides quantitative and essential information to improve the efficiency of beam transport. We have developed an on-line pepper-pot-type emittance meter, which is a suitable device to obtain the 4-D phase-space distribution from an image of beamlets passing through the well-aligned pinholes. The emittance meter consists of a thin metal plate with a pinhole array, which is translated along the beam axis, and an imaging screen (P46) with a MCP. We optimized the analysis procedure to obtain the distribution so that the elapsed time of the process was shortened as less than 1 second, and which was enough short for on-line measurements. We will discuss the quality of the obtained 4-D distribution by comparing it with the one obtained from a simulation. Further, we will also discuss how the gas pressure of LEBT affects the 4-D distribution to establish to improve the beam brightness.

Poster WEPP35 [2.753 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-ECRIS2016-WEPP35

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)