Measurement of Microwave Frequencies Emitted by Instabilities of ECRIS Plasma with Waveguide Filters and Microwave Sensitive Diodes

Orpana, Joose; Izotov, Ivan; Kalvas, Taneli; Koivisto, Hannu; Kronholm, Risto; Laulainen, Janne; Mansfeld, Dmitriy; Skalyga, Vadim; Tarvainen, Olli

doi:10.18429/JACoW-ECRIS2016-WEPP41

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BiBTeX citation export for WEPP41: Measurement of Microwave Frequencies Emitted by Instabilities of ECRIS Plasma with Waveguide Filters and Microwave Sensitive Diodes

@InProceedings{Orpana:ECRIS2016-WEPP41,
  author       = {J. Orpana and others},
  title        = {{M}easurement of {M}icrowave {F}requencies {E}mitted by {I}nstabilities of {ECRIS} {P}lasma with {W}aveguide {F}ilters and {M}icrowave {S}ensitive {D}iodes},
  booktitle    = {Proc. of International Workshop on ECR Ion Sources (ECRIS'16),
                  Busan, Korea, August 28 - September 1, 2016},
  pages        = {134--137},
  paper        = {WEPP41},
  language     = {english},
  keywords     = {ion, plasma, ECR, ECRIS, diagnostics},
  venue        = {Busan, Korea},
  series       = {International Workshop on ECR Ion Sources},
  number       = {22},
  publisher    = {JACoW},
  address      = {Geneva, Switzerland},
  month        = {Oct.},
  year         = {2016},
  isbn         = {978-3-95450-186-1},
  doi          = {https://doi.org/10.18429/JACoW-ECRIS2016-WEPP41},
  url          = {http://jacow.org/ecris2016/papers/wepp41.pdf},
  note         = {https://doi.org/10.18429/JACoW-ECRIS2016-WEPP41},
}